Product Products
Digital bridge
Product description
The product description
Product name: digital bridge product model: lx-2011
The measurement objects of lx-2011 digital bridge are the parameters of impedance elements, including ac resistance R, inductance L and its quality factor Q, and capacitance C and its loss factor D. Therefore, the digital bridge is often referred to as a digital LCR measuring instrument. The measured frequency is self - working to about 100 KHZ. The error of basic measurement is 0.02%, which is generally around 0.1%.
Lx-2011 digital bridge a wide range of measurement objects
Semiconductor components: measurement of impedance parameters of capacitors, inductors, magnetic cores, resistors, transformers, chip components and network components.
Other components: impedance assessment for printed circuit boards, relays, switches, cables, batteries, etc.
Dielectric materials: loss Angle assessment of dielectric constant of plastics, ceramics and other materials.
Magnetic materials: evaluation of the permeability and loss angles of ferrites, amorphous and other magnetic materials.
Semiconductor materials: dielectric constant, conductivity, and c-v properties of semiconductor materials.
Liquid crystal material: the dielectric constant, elastic constant and other c-v characteristics of liquid crystal unit.
Ability to measure the properties of various components and materials
Multi - parameter mixed display function
Multi-parameter display can meet the requirements of comprehensive observation and evaluation of various distributed parameters of complex components without repeated switching of measurement parameters.
The inductance L and its dc resistance DCR can be measured and displayed at the same time, which can significantly improve the measurement efficiency of inductance.
Various characteristics of inductance devices are revealed
The performance of magnetic materials and inductive devices can be accurately analyzed by using internal/external dc bias and in combination with various scanning test functions.
Through the bias current stack test function, the small current stack performance of high-frequency inductance devices, communication transformers and filters can be accurately measured. Using an external current stack device, the offset current can be up to 40A for accurate analysis of high power, high current inductance devices.
Accurate measurement of ceramic capacitance
1kHz and 1MHz are the main test frequencies for ceramic materials and capacitors. Ceramic capacitors have the characteristics of low loss value, and their capacity and the ac signal of loss will change obviously.
The instrument has broadband testing capability and can provide good accuracy, six resolution and automatic level control (ALC) functions, etc., to meet the needs of reliable and accurate testing of ceramic materials and capacitors.
Measurement of capacitance characteristics of liquid crystal units
The capacitor-voltage (c-vac) characteristic is the main method to evaluate the performance of liquid crystal materials.
Programmable test signal levels with resolution of 1% and up to 20Vms can be provided using the extended measurement option, enabling it to measure capacitance characteristics of liquid crystal materials under optimal conditions.
Measurement of semiconductor materials and components
Parameters such as oxide capacitance and substrate impurity density are required for MOS semiconductor fabrication process evaluation, which can be derived from the measurement results of c-vdc characteristics.
By providing dc source and combining with various scanning functions, the measurement of c-vdc characteristics can be easily completed.
In order to test the semiconductor device on the wafer, the extension cable and the probe are required. The 1m/2m/4m extension cable option of the instrument minimizes the error of cable extension.
The distributed capacitance of various diodes, transistors and MOS tubes is also the test content of this instrument.
The lx-2011 digital bridge can be used for the verification and transfer of impedance gauges in metrology and test departments, as well as the routine measurement of impedance elements in general departments. Many digital Bridges have standard interfaces, which can automatically classify the measured components according to the accuracy of the measured values. It can also be directly connected to the automatic test system for the automatic inspection of products on the component production line to achieve the quality control of the production process.